Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Assuring you our best, always

1st Optical Inspection System
WIS1000

Microscopy based wafer inspection system integrated with wafer autoloader, macro front and back inspection and micro-inspection with multiple objective lenses and selectable illumination technique like bright-field, dark-field and normaski interference contrast. 
Specifications
  • Designed for 6" and 8" wafer inspection.
  • Automatic wafer loading and unloading with OCR reader.
  • Programmable XY stages with point-and-shoot wafer alignment algorithms.
  • Wafer Mapping and simple defect classification.
  • Anti-vibration platform ensuring good images during the micro inspection.
  • Ergonomic design based on SEMI S2/S8 requirement.
  • Optional Inking module for Reject Identification
  • Optional SECS/GEM communication for wafer map and recipe transfer
Please contact us for more information