SII Nanotechnology Inc.

Fluorescent X-Ray Coating Thickness Gauge
SFT 9200

• 5W power X-ray for general purpose of coating thickness for a large variety of applications
• 0.1, 0.2, 0.3mm collimator for smaller measurement area
• Laser focus aid

Fluorescent X-Ray Coating Thickness Gauge
SFT 9300

• 75W high power X-ray provides more accurate measurement result and shorter measurement time
• 15µm collimator for smaller measurement area
• Zoom optic system for better positioning accuracy
• Laser focus aid
• Measure from atom No 22(Ti) to 83(Bi)
• Spectrum matching for material determination
• Bulk calibration for plating liquid measurement

High Performance XRF Coating Thickness Gauge with RoHS Capability
SFT 9500 

• X-ray Capillary System provides fluorescent X-ray intensity 10 times that of conventional methods
• High Resolution Liquid Nitrogen Free Semiconductor Detector
• Laser focus aid
• Measure from atom No.13(Al) to 83(Bi)
• Spectrum matching for material determination
• RoHS & WEEE directive compliance for Hazardous Substance monitoring
• Multilayered Ultra Thin Film coating thickness measurement

Energy Dispersive Fluorescent X-Ray Analyzer
SEA 1000AII  

• Element Analyzer for Sulfur to Uranium in solid, powder or liquid form
• HS (Hazardous substances like Cd, Pb, Hg…) monitor compatible to WEEE and RoHS directive
• Large chamber for various sample type and size
• High counting circuit for short measurement time
• Low running cost with no liquid Nitrogen required
• Auto filter switching
• Small analysis area down to 1mm
  

Ultra High Resolution XRF Element Analyzer
SEA 1200VX   

• Liquid Nitrogen free, high sensitivity & high resolution detector
• Improved processing capability for shorter measurement time
• Very low detection limit (Cd 1ppm, Pb 0.7ppm in PVC)
• 5 modes of auto changing primary filter
• 1mm & 8mm selectable collimator for different analysis area
• RoHS & WEEE directive compliance for hazardous substance monitoring
• Optional vacuum pump for light element analysis

High Sensitivity Fluorescent X-ray Analyzer
SEA 6000VX  

• Latest and highest sensitivity fluorescent X-ray analyzer
• Equipped with  high speed “Integrated Mapping” capability, with world class speed
• High precision, micro-spot analysis of film thickness composition
• 6 modes of auto adjust primary filter
• Beam size down to 0.2, 0.5, 1.2 and 3mm Auto adjust
• High count rate “Vortex” detector that does not require liquid nitrogen Wide exposure area 250mm X 200mm which good for PCB checking

Review AFM Unit
SPA-460 / SPA-465
 
The Review Station AFM unit can detect the position of 0.08µm level defects on a wafer accurately and in a short time. By using the coordinate data linkage and the super accurate position determination mechanism enabled by laser dispersion, observation of fine particles and defects in bare wafer is enabled.

Scanning Probe Microscope / Atomic Force Microscope

Large Stage SPM Unit
L-trace II

L – trace II is designed with rigidity thoroughly in mind. This large stage SPM unit is capable of reviewing samples of up to 6 inches while achieves high resolution comparable to a smaller size unit.

Multi-Function Unit
S- image

The S- image comes standard with AFM and MFM. Optional KFM, VE-AFM STM and other types of measurement can be performed through easy cantilever exchange.
 

Probe Station, Nanonavi Station

The Nanonavi Station satisfies your needs for high resolution, high speed and ease of use that is required for probe station in system control and analysis.