HITACHI HIGH-TECH

  • EA1000AIII

    The EA1000AIII Fluorescent X-ray Analyzer is being developed based on optimal costing. This can be achieved by developing precision control and standardized software. Also, compared to our previous models, inspection tome is reduced by 1/3 and throughput improved. New Material Identification Measure Mode is easier for users to select recipe file.


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  • EA1000VX

    The EA1000VX is fully adapted to the recent requirement for environmental regulation. It can quickly measures hazardous substances with ease. Higher speed measurements and various new functions greatly improves inspection efficiency.


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  • EA1200VX

    Meeting both demands for screening inspection in compliance with RoHS/ELV. It has advanced analysis features. Equipped with the unique XRF detector "Vortex" that has high resolution, high sensitivity and high count rate. EA1200VX remarkably improves sensitivity. Combined with precision control software, it greatly shortens measurement time.


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  • EA6000VX

    The EA6000VX has the capability of measuring hazardous substances over the entire surface are of the sample. With this mapping ability, it can measure a specific microscopic point within the mapped area. These tasks cannot be done by conventional instruments.


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  • FT110A

    The FT110A has a new auto focus function which allows the samples optical image to be focused within a few seconds automatically. Thus the onerous manual adjustment is not required, resulting in drastic improvement in throughput. Wide view observation is designed specially for PCB board to achieve images with ease.


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  • FT150

    The latest development of FT150 is an optimal device for ultra thin coatings of micro connectors, flexible boards and lead frames. It utilized a high luminance, 30µm diameter X-ray beam delivered bu poly-capillary optics. FT150h is a model capable of challenging coating thickness measurements including tin(Sn) and silver (Ag). Newly developed software offers improved operability and efficient data management.


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