Automotive & Metal

  • Laser Radar (Large Scale Metrology)

    Laser Radar is the only solution available that provides automated, non-contact measurement capability for large-volume applications of up to 50 meter radius. The new generation of metrology instruments precisely measures large-scale geometry without requiring photogrammetry targets, laser tracker spherically mounted retro-reflectors, retro-reflector or probes.


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  • Loresta/Hiresta series

    Loresta and Hiresta series are JIS-compliant and have been adopted as the de facto standard in many industries. High performance and extensive range of measurement for various types of materials, powder samples and large samples. Reliable 4-pin probe methods is using for low resistivity. Both surface & volume resistivity can be measured in high resistivity range.


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  • Measuring Microscope

    New series of innovative and measuring microscopes designed for industrial measurement and image analysis. They integrate key performance features to ensure and guarantee the accuracy in demanding industrial environments. This system also also able to integrate into E-Max software, U-DP software and DP-E1 data processor for metrology applications.


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  • Non Contact 3D Surface Profiler

    Nikon BW series is a perfect solution for surface analysis using white light interferometry technology (also known as Two Beam Interferometry). It covers wide range of application, from rough surface to smooth surface and offers highest Z resolution 3D analysis, able to achieve up to 1pm resolution. 2 types of camera: High quality (BW-S) and high speed (BW-D). Nikon BW is available in manual operation or fully automated and programmable system.


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  • Portable Scanner & 3D Printer

    Geomagic Capture is a powerful turnkey 3D scanner that enables fast inspection and reverse engineering. Small yet powerful system that used the power of blue LED structured light for accurate scanning. Compact and portable system, fits easily in a suitcase for travel convenience. All scan artwork can be print from 3D printer as total reserve engineering solution.


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  • Profile Projector

    Optical comparator with enhanced features for improved precision and easy operation. It has oblique illumination for superior sharp images. Available in 3 different screen sizes - 12", 20" and 24". V-12 and V-20 is able to cater stage size from 2x2" up to 10x6". V-24 stage size is 9x4". This system also able to integrate into E-Max software, U-DP software and DP-E1 data processor for metrology applications.


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  • SPECTRO ARCOS

    The new SPECTRO ARCOS represents a new pinnacle of productivity and performance for ICP-OES spectrometers Its unique new MultiView plasma interface option provides truly uncompromising axial-view and radial-view plasma observation in a single instrument. Finally SPECTRO ARCOS delivers unmatched performance, without any need for added techniques or instruments.


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  • SPECTRO GENESIS

    The SPECTRO GENESIS ICP-OES is the first ICP-OES spectrometer available with a complete set of factory methods - truly "Plug & Analyze" without needing to first develop a method. SPECTRO GENESIS offers a real economic alternative to sequential ICP-OES and Atomic Absorption  Spectrometers (AAS). Spectro GENESIS is setting a new standard in the analysis of wear metals in oils for condition monitoring.


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  • SPECTRO MS

    A pioneering leap in technology. The SPECTRO MS takes ICP mass spectrometery to a place it's never been. The new DCD detector enables the fundamental leap in mass spectrometry from sequential to simultaneous measurement of the mass spectrum. Together with its Mattauch-Herzog sector field mass spectrometer the SPECTRO MS completely unique on market.


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  • SPECTRO SCOUT

    SPECTROSCOUT ED-XRF analyzers deliver much of the analytical power of top-grade laboratory benchtop analyzers. They provide fast, dependable, truly lab-quality results in the field or on the production floor – all at a surprisingly low cost. They provide exceptional performance, at wide concentration levels, for all of the relevant elements in the range of Na-U. SPECTROSCOUT impresses with unprecedented precision and speed making it the ideal portable XRF for onsite applications where results matter.


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  • SPECTRO XEPOS

    The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. lt leads SPECTRO's newest generation of ED-XRF instruments, providing breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations.


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  • SPECTRO Xsort

    Spectro Xsort comes with three difference model: Alloy, Alloy plus and Non-Alloy. It is useful in precise analysis of stainless steel in manufacturing process, PMI applications in Oil and Gas Industry, Metal Recycling Industry, Mining Industry and environmental. High resolution silicon drifts detector (SDD), providing unique analytical flexibility speed, accuracy, and high-volume productivity. Intelligent Calibration logic (ICAL) system. Metal analysis and grade identification in only 2 seconds for almost all alloys.


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  • SPECTROBLUE

    The SPECTROBLUE defines a future safe, high performance ICP-OES solution at an affordable price - it's a perfect ICP that fits for environmental analytical work. SPECTROBLUE utilized revolutionary UV-PLUS gas Purification technology plus a breakthrough OPI-Air interface that avoid costly, complicated external wafer coding. With its excellence performance of UV-PLUS system, SPECTROBLUE enable to measure hydride elements without hydride generator system.


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  • SpectroCheck

    SpectroCheck stationary metal analyzer is specifically designed to meet the performance requirements and the budgets of small & medium size foundries & machining operations. This high-quality, compact, affordable instrument is ideal for routine analysis of element content in (Fe, Al, Cu) based metals. The effective wavelength from 178-611nm. Low cost of ownership, plug-in functionality, simple to operate and easy to maintain. Its optical system consists with high resolution CCD detectors.


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  • SPECTROLAB

    SPECTROLAB offers a pair of innovative approaches to high-performance OES. A hybrid model combines two technologies-analog photomultiplier tube (PMT) detectors and digital charge coupled device (CCD) sensors-to present an ultra-accurate simultaneous measure-ment. It’s ideal for R&D, trace element measurement, and precious metals analysis. Alternatively, a new highly sophisticated; all-CCD model provides fast, accurate, ultra-flexible analysis for multi-matrix applications. It offers impres¬sive results on process control and quality control of fabricated and finished goods. Lowest detection limits and covers the complete spectrum from 120-780nm


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  • SPECTROMAXx

    SPECTROMAXx provide accurate analysis of all the important chemical elements in metal industrial. High resolution CCD multiple detectors. A complete analysis requires an average of 25 seconds. The optical system covers the wavelength range 140 - 670nm. New elements or even complete calibrations can be easily added at any time. Recalibrate with Intelligent Calculation Logic (ICAL) system by single control sample.


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  • Spectroport

    Spectro-Port is a universal metal analyzer for metal producing, processing and recycling industries. It consists of plasma generator, special optics, high performance readout system and ICAL 2.0 logic system. The effective wavelength from 165-530nm. It is a high mobility, immediately ready for measurement at anywhere. The weight of equipment only 19.8kg.


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  • SPECTROTEST

    A universal metal anayzer for metal producing, processing and recycling industries. With multiple CCD detectors, it providers complete wavelength coverage 185-670nm. It consists of plasma generator, special optics, high performance readout system and ICAL logic system. Simple, convenient and safe operation. High mobility, immediately ready for measurement at anywhere. It can be used cordless with battery in difficult to reach places for material analysis or grade identification.


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  • TAC1000

    TAC1000 Pressure-Sensitive Tack of Adhesive Test equipment measures adhesive of solder paste, tape and other adhesive materials. This method is to measure the adhesive force by pressuring and separating the adhesive side of samples using the probe.


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  • X-ray Inspection System

    Nikon manufactures X-ray and Computed Tomography (CT) inspection systems to get the inside picture of complex industrial parts, by looking into the internal structure. The CT capability is used to qualify and quantify any inner or outer dimension in a smooth and non-destructive process. All models are using micro focus, and open tube source, and Nikon is the only company produce the 320kV and above microfocus X-ray source.


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