Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Assuring you our best, always

RoHS & ELV Analyser
EA6000VX

The EA6000VX High-Sensitivity XRF Analyzer is capable of determining hazardous substances over entire surfaces as well as measuring microscopic points in a specified area; tasks that are not possible using conventional XRF instruments.  The high count rate detector (max. 150,000 cps) and the large stage that scans a max. 250 mm × 200 mm area provide the high-speed mapping. For example, when mapping a 100 mm × 100 mm area, the EA6000VX can detect and specify the location of lead contained in the terminal of a mounting board in just a few minutes.

Key benefits
  • Continuous multi-point Measurements
  • High-speed Mapping
  • High Count Rate Detector with No LN2 Required
  • High Precision Overlap Function
  • Microscopic Area Coating Thickness Measurements
  • RoHS Inspection
  • Light Element Measurement
  • Contaminant Analysis
Specs & Applications
  • Elements:  Atomic Number: 12 (Mg) to 92 (U);  11(Na) to 92(u) (Helium purge)
  • Sample Type:  Solid, Powder, Liquid
  • X-ray Tube:  Air-cooled X-ray tube (Rh/w target)
  • Voltage:  15kV, 30kV, 40kV, 50kV
  • Current:  20µA to 1000µA
  • Detector:  Vortex Si semiconductor detector (liquid nitrogen free)
  • Analysis Area:  Square 0.2mm, 0.5mm, 1.2mm, 3mm (electric switching)
  • Chamber:  580(W)x450(D)x150(H) mm;  Point and map 250 (X) x 200 (Y) mm
  • Filters:  6 mode automatic switching (including OFF)
Please contact us for more information