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Wafer Roughness Measuring System
MPS 2100

The MP2100 is Chapman Instruments’ latest high-resolution profiler . Specially designed for surface measurements and analysis, it can be used as both a production tool for inline quality inspection, as well as a research and development tool for establishing standards and researching tolerances.

The MP2100 utilizes the same non-contact measurement technology as other Chapman profilers. Users can make either high-resolution linear or circular scans quickly. The powerful, yet user-friendly, Windows® based operational software can be programmed to execute a series of routines and report the data off-line for further analysis. Password security and event viewer/error logging are standard with Chapman software.

Robotic handling for 150 mm, 200 mm and 300 mm wafers is available as an option.
Please contact us for more information